The ability of high power microwave (HPM) radiation to disrupt microelectronic systems has been studied for some time. The development of HPM countermeasures has reached a critical level of importance due to the proliferation of microelectronic technology throughout the civil infrastructure. Many vital systems such as economic, emergency medical and power systems remain vulnerable to intentional and un-intentional disruption from HPM radiation. In order to more effectively develop and test countermeasures, the fundamental mechanism of HPM induced disturbance within electronic systems must be understood and modeled. I am conducting experimental research to develop accurate scalable models to predict the upset effects caused nonlinear electromagnetic effects in microelectronic systems. This research will build upon the success achieved in modeling simple microelectronic devices by progressively expanding the model to account for increasingly realistic complexity.