Open-Ended Coaxial Probe for High Temperature and Broad-Band Dielectric Measurements
D. Gershon, J. P. Calame, Y. Carmel, and T. M. Antonsen, Jr.
Institute for Plasma Research, University of Maryland, College Park, MD 20742
IEEE Transactions on Microwave Theory and Techniques 47 [9], 1999
ABSTRACT. A stainless steel open-ended coaxial probe was developed to measure the complex permittivity of solid dielectric materials at elevated temperatures and over a broad frequency range. The spring loading of the inner conductor insured that the probe
maintained contact with the sample up to 1000oC and eliminated errors due to differential thermal expansion of the probe. Comparison with an industry standard probe demonstrated that the spring-loaded probe accurately and reproducibly measured the complex permittivity of several samples over a broad frequency range of 0.3 to 6 GHz at room temperature. At temperatures up to 1000oC, dielectric measurements of a glass
ceramic and of a porous alumina composite performed with both a spring-loaded probe
and a resonant cavity agreed to within 8% for the real part and 15% for the imaginary
part of the complex permittivity. The probe's insensitivity in measuring low loss
materials constrained accurate dielectric measurements to materials with a loss tangent
greater than O.O5. Finally, optimization of an open-ended probe by varying the probe
dimensions is presented.