John Melngailis, Professor, received the B.S., M.S., and Ph.D. in physics from Carnegie Mellon University. He joined the University of Maryland in 1993 and holds a joint appointment with the Department of Electrical and Computer Engineering and the Institute for Research in Electronics and Applied Physics. He is a Fellow of the Institute of Electrical and Electronic Engineers.

His current research interests are Focused Ion Beam (FIB) nanofabrication, RFID tags and sensors, RFID tags with FIB implanted identity, the effects of RF pulses on chips, ferroelectric properties at nanometer dimensions, and electrical contacts to nanofibers and nanotubes.

John Barry, Engineering Technician, graduated with a B.S. in physics from the University of Tennessee at Chatanooga in 1979. He worked for Litton Industries from 1979 to 1997 as a laser gyroscope design engineer. He joined the University of Maryland in 1998 to work with the LIBRA group and is responsible for focused ion beam processing and scanning electron microscopy.

Jon Orloff, Professor (Retired), received the B.S. from the Massachusetts Institute of Technology in 1964 and a Ph.D. from Oregon Graduate Institute in 1977. Prior to coming to the University of Maryland in 1993, Professor Orloff was on the faculty of the Electrical Engineering and Applied Physics Department at the Oregon Graduate Institute, where he worked on the development and applications of high resolution focused ion beam technology. As a partner in a spin-off company from OGI (FEI Company) he developed some of the first focused ion beam systems utilizing liquid metal ion source technology. He is a Fellow of the Institute of Electrical and Electronic Engineers (IEEE) and a Fellow of the American Association for the Advancement of Science (AAAS).

His current research interests are high resolution focused ion beams and their applications and high brightness electron and ion sources.